Cover Image for EIS → DRT → Root Cause in 30 Minutes Hands-on workshop: automated DRT classification + recommended next tests
Cover Image for EIS → DRT → Root Cause in 30 Minutes Hands-on workshop: automated DRT classification + recommended next tests

EIS → DRT → Root Cause in 30 Minutes Hands-on workshop: automated DRT classification + recommended next tests

Hosted by Raj Bhakta & Mariam Awara
Virtual
Registration
Welcome! To join the event, please register below.
About Event

EIS → DRT → Root Cause in 30 Minutes Hands-on workshop: automated DRT classification + recommended next tests

Host:
Pulsenics
https://www.pulsenics.com/

Pulsenics provides electrochemical performance data, rapidly and in real-time for R&D and Production. We're trusted by 100s of R&D & Production teams from $B companies, innovative start-ups, & academic research labs.

When / Where:
Virtual (Luma). Recording provided to registrants.

Who it’s for:
- Battery and electrochem R&D, quality, process/formation, and manufacturing teams.
- Decision makers evaluating faster diagnostics, higher yield, and quicker root-cause loops.

What you’ll learn (and do live):

  • Upload an EIS spectrum and generate a DRT in minutes

  • Automatically classify dominant processes / defect signatures from DRT + QC checks

  • Get an AI “next-step” playbook: measurement fixes, follow-up experiments, and mitigation actions

  • See examples: clean vs noisy spectra, ambiguous Nyquist cases, and how DRT clarifies decisions

Workshop format (60 min):

  • 10 min: Why DRT for faster interpretation (no circuit guessing)

  • 30 min: Live tool walkthrough + hands-on exercises

  • 15 min: Case studies + how teams deploy privately (no data retention / on-prem options)

  • 5 min: Q&A + optional follow-up diagnostic session

What to bring:
Optional: 1–3 EIS spectra (CSV) to test during the workshop.

Bonus for attendees:
Free post-webinar “DRT + root-cause triage” review for qualified teams.

RSVP:
[Insert Luma registration link]